Books : Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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Books : Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by: Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury

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List Price: $89.95

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Binding: Hardcover
Dewey Decimal Number: 502.825
EAN: 9780306421402
ISBN: 0306421402
Label: Plenum Press
Manufacturer: Plenum Press
Number Of Items: 1
Number Of Pages: 466
Publication Date: March 31, 1986
Publisher: Plenum Press
Sales Rank: 1209458
Studio: Plenum Press

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