Product DescriptionScanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Customer Reviews
Average Rating:
Rating: - A very good book
This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers.
With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques.
While some of the references cited are German literatures, the book provides the best guide for ... Read More
